Long-term reliability for VUV detection

Certain types of photodetectors, such as MPPC (Multi-Pixel Photon Counter), are so sensitive that they allow the detection of a single photon. This is incredibly useful for High-Energy Physics experiments where there is a need to detect single photonabsorption events.


As widely recognized, silicon devices can exhibit degradation in their characteristics when employed for the detection of UV/VUV radiation, a common occurrence in scientific experiments. The extent of this degradation depends on factors such as UV/VUV irradiation intensity, usage duration, and ambient temperature. Notably, the device may undergo a reduction in UV sensitivity and an increase in dark current over time.


Due to the inherent limitations of resin in preventing UV/VUV photon absorption by silicon, the semiconductor surface remains vulnerable. This exposes the device to a heightened risk of damage from UV light, emphasizing the importance of considering these factors for the long-term reliability of MPPCs used in VUV detection.


Hamamatsu Photonics is continuously developing technology that enables the creation of VUV detection devices without the use of resin. This technology allows for the production of chips that are highly resistant to UV light over the long term.


For more information and to find the appropriate MPPC device for your application, please contact Hamamatsu.

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